Nova V2600™ qualified as tool of record for logic and memory applications REHOVOT, Israel , July 8, 2014 /PRNewswire/ --
Nova Measuring Instruments (Nasdaq: NVMI ) , a leading innovator and a key provider of optical metrology solutions for advanced process control used in semiconductor manufacturing, announced today that a major customer in Asia placed an order for its Through-Silicon-Via (TSV) metrology solution.
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